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Escola Brasileira de Espectroscopia de Absorção de raios-X encerra-se com sucesso em São Carlos

Na última semana, entre os dias 30 de março e 02 de abril, ocorreu no Instituto de Física de São Carlos, Universidade de São Paulo, a 1a Escola Brasileira de Espectroscopia de Absorção de raios-x (EBARX), organizada pelo coordenador do Grupo de Pesquisa Crescimento de Cristais e Materiais Cerâmicos, Prof. Valmor Roberto Mastelaro. O evento contou com apoio do Centro para o Desenvolvimento de Materiais Funcionais (CDMF), da CAPES e do Instituto de Física de São Carlos (IFSC) e recebeu 67 pesquisadores de Instituições de todo Brasil os quais participaram de aulas teóricas e práticas de análise durante a EBARX.

Ciclo Semanal de Seminários do CCMC

Ceramics based bismuth vanadate are conductors of oxygen ions and they are used as solid electrolytes in pressure sensors and fuel cells. The g-phase of Bi4V2O11 can be stabilized at T0 by partial substitution of V5+ ion by Cu2+ and Zn2+ ions to provide high electrical conductivity values between 100 and 400oC. Polycrystalline samples of Bi4V1.8Cu0.1Zn0.1O10.7 were obtained after 4h sintering at 800 °C. Investigations were made about densification process and electrical conductivity related to the effect of addition of Zr0.88Y0.12O1.94.


Polymeric precursor method to the synthesis of XWO4 (X = Ca and Sr) thin films—Structural, microstructural and spectroscopic investigations

Stoichiometric XWO4 (X = Ca, and Sr) thin films were synthesized using the polymeric precursor method. In this soft chemical method, soluble precursors such as strontium carbonate, calcium carbonate and tungstic acid, as starting materials, were mixed in an aqueous solution. Through the polyesterification reaction, evidences of the formation of the W-citrate complex and the strontium were obtained by 13C NMR and FT-Raman spectroscopy. The thin films were deposited on silicon and platinum-coated silicon substrates through the spinning technique. The surface morphology and crystal structure of the thin films were investigated using atomic force microscopy (AFM), X-ray diffraction (XRD), specular reflectance infrared Fourier transform spectroscopy, and micro-Raman spectroscopy. Nucleation stages and surface morphology evolution of the thin films on silicon substrates were studied by atomic force microscopy. X-ray diffraction characterization of these films showed that the XWO4 (X = Ca, and Sr) thin film phases crystallize at 500 °C from an inorganic amorphous phase, given that no intermediate crystalline phase was identified.

Fenelon Martinho Lima Pontes, M.S. Galhiane, L.S. Santos, L.A. Petit, Francini Pizzinato Kataoka, G.H. Mabuchi, Elson Longo, Marcelo Zampieri, Paulo Sérgio Pizani

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XXXVIII Congresso del Chimici Teorici di Esspresione Latine (Quitel 2012)


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galeria/ Fotomicrografia referente a sistemas a base de ZnO.
 

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